Issue link: https://read.uberflip.com/i/1527095
LoRaWAN ® Certification Protocol Specification TS009-1.2.1 ©2024 LoRa Alliance ® Page 8 of 27 The authors reserve the right to change specifications without notice. 3 Functional Test Description for LoRaWAN Certification 213 214 The list of tests specified on regional certification documents reflect functional requirements 215 of an end-device as defined by the targeted LoRaWAN specification. The tests are conducted 216 in the LCTT, which is comprised of: 217 • Test Control Layer [TCL] 218 • LoRaWAN Network Server [NS] 219 • LoRaWAN gateway [GW] 220 • Device Under Test [DUT] 221 Figure 2: LCTT architecture The TCL is a framework of automated scripts and tools that manipulate the NS to facilitate 222 the tests. Specifically, the TCL drives events in the LCTT, controlling application and network- 223 control content of downlinks. It also decrypts, inspects, and validates content of uplinks sent 224 by the DUT. This allows test coverage to include: 225 • Cryptography 226 • Timing of the DUT receive windows 227 • Frequency channel usage and data rate adaptation 228 • Maximum payload length handling 229 230 For brevity, this document makes procedural reference to only the TCL, NS, GW, and DUT. 231 232 The GW and DUT are collocated in an RF-isolated environment, provisioned as necessary 233 for reliable bi-directional communication. It is nonetheless expected that both the DUT and 234 GW will not receive every frame intended for reception. The TCL SHOULD make a 235 reasonable effort to accommodate this inevitability. 236